DI QCIC 81708 数据项说明 非标准零件鉴定质量一致性测试计划(2006年11月24日)

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页数:6页

时间:2023-03-17

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上传者:战必胜
DATA ITEM DESCRIPTION
Title: Non-Standard Part Qualification/Quality Conformance Test Plan
Number: DI-QCIC-81708 Approval Date: 24 NOV 2006
AMSC Number: 7662 Limitation: N/A
DTIC Applicable: No GIDEP Applicable: No
Office of Primary Responsibility: NS/I5231
Applicable Forms: N/A
Use/Relationship:
The purpose of the plan is to document the qualification and quality conformance
procedure, including tests to be performed, order of testing, sample sizes, and other
pertinent data relating to the qualification of non-standard parts.
This Data Item Description (DID) contains the format and content preparation
instructions for the Non-Standard Part Qualification/Quality Conformance Test Plan.
This DID shall be used in conjunction with MIL-PRF-38535 (G) 1, “General
Specification for Integrated Circuit Manufacturing,” (entire document), MIL-PRF-38534
(F), “General Specification for Hybrid Microcircuits,” (entire document), MIL-STD-
883G, “Test Method Standard for Microcircuits,” (Test Method 5004.11, Screening
Procedures and Test Method 5005.14, Qualification and Quality Conformance
Procedures) and other appropriate component specifications and program requirement
documentation to ensure the parts are qualified to the appropriate reliability level (high
reliability, military, industrial, commercial) and operating environment (space, tactical,
ground, etc.).
All custom microcircuits are considered non-standard parts. All non-custom integrated
circuits, discrete components, magnetics, passives, etc. which are not procured as
Qualified Products List (QPL), Qualified Manufacturers List (QML) or Standard
Microcircuit Drawing (SMD) parts are considered non-standard parts.
The following parts do not require the submission of a full Non-Standard
Qualification/Quality Conformance Plan when the parts are considered non-standard
because of additional space environment requirements such as Destructive Physical
Analysis or Radiation. The submission of an abbreviated plan shall be required to state
that the devices are being procured as QML, QPL or SMD parts and shall detail only the
additional tests that are required.
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